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Scanning Electron Microscopy

Philips XL30 FEG Field Emission Scanning Electron Microscope

Field Emission Electron Sources provide much greater resolution than with conventional SEM , especially at lower voltages. This allows much better imaging of fine surface detail and observation of delicate and uncoated specimens. The features of this microscope include:

Easy-to-use Windows graphical user interface
High resolution over a wide range of acceleration voltages
Low acceleration voltage for delicate surface detail and uncoated specimens
Captures images to photographic film or directly to disc
Video printer for immediate recording of images
Secondary and backscattered electron detectors
Suitable for both large and small specimens
Working distances from 3mm to 30mm

Micrographs taken on this equipment.

Green algal spore.

Leaf surface of Corymbia citriodora.

For more information from the manufacturer of this microscope, visit the Philips XL30 site

Specimen Preparation

Critical Point Drying

Balzers CPD 030 Critical Point Dryer
Allows drying of the tissue without deformation or collapse of the structure

Coating

Dynavac "Xenosput" magnetron sputter coater

High resolution coater for ultrafine-grain platinum or chromium coating

Edwards S150B Gold Sputter Coater

Standard gold coating for routine specimens

sput1

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