Faculty of Science School of Botany

Scanning Electron Microscopy

xl30 feg
Philips XL30 FEG Field Emission Scanning Electron Microscope

Field Emission Electron Sources provide much greater resolution than with conventional SEM , especially at lower voltages. This allows much better imaging of fine surface detail and observation of delicate and uncoated specimens. The features of this microscope include:

Micrographs taken on this equipment.

algal spore
Green algal spore.

leaf surface
Leaf surface of Corymbia citriodora.

For more information from the manufacturer of this microscope, visit the Philips XL30 site

 

Specimen Preparation

Critical Point Drying

Balzers CPD 030 Critical Point Dryer
Allows drying of the tissue without deformation or collapse of the structure

Critical Point Dryer

 

Coating

Dynavac "Xenosput" magnetron sputter coater

High resolution coater for ultrafine-grain platinum or chromium coating

Magnetron Sputter Coater

 

Edwards S150B Gold Sputter Coater

Standard gold coating for routine specimens

sput1

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