Scanning Electron Microscopy
Philips XL30 FEG Field Emission Scanning Electron Microscope
Field Emission Electron Sources provide much greater resolution than with conventional SEM , especially at lower voltages. This allows much better imaging of fine surface detail and observation of delicate and uncoated specimens. The features of this microscope include:
- Easy-to-use Windows graphical user interface
- High resolution over a wide range of acceleration voltages
- Low acceleration voltage for delicate surface detail and uncoated specimens
- Captures images to photographic film or directly to disc
- Video printer for immediate recording of images
- Secondary and backscattered electron detectors
- Suitable for both large and small specimens
- Working distances from 3mm to 30mm
Micrographs taken on this equipment.
Green algal spore.
Leaf surface of Corymbia citriodora.
For more information from the manufacturer of this microscope, visit the Philips XL30 site
Specimen Preparation
Critical Point Drying
Balzers CPD 030 Critical Point Dryer
Allows drying of the tissue without deformation or collapse
of the structure
Coating
Dynavac "Xenosput" magnetron sputter coater
High resolution coater for ultrafine-grain platinum or chromium coating
Edwards S150B Gold Sputter Coater
Standard gold coating for routine specimens
