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Scanning Electron Microscopy
Field Emission Electron Sources provide much greater resolution than with conventional SEM , especially at lower voltages. This allows much better imaging of fine surface detail and observation of delicate and uncoated specimens. The features of this microscope include:
Micrographs taken on this equipment.
For more information from the manufacturer of this microscope, visit the Philips XL30 site
Specimen PreparationCritical Point Drying Balzers CPD 030 Critical Point Dryer
CoatingDynavac "Xenosput" magnetron sputter coater High resolution coater for ultrafine-grain platinum or chromium coating
Edwards S150B Gold Sputter Coater Standard gold coating for routine specimens
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Date Created:
1 September, 2004
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